Seminar2:“The reliability challenge for advanced technologies: A critical concern for research, production, economy and modern society”
授课人：Professor Yves DANTO
1-How electronics governs all the human activity
2-The“Difficult Reliability Challenge“
3-Basics of failure physics
4-The ESD/EOS nightmare
5-The cosmic particle bombing on advanced technologies
6-The trivialization of very hard operating conditions
7-The device Packaging: A strategic situation
Following this introducting course, 5 topics will be proposed to students They will be asked to elaborate a written report and to make an oral presentation
Yves DANTO received the Ph.D degree in electronics from the University of Bordeaux, France, in 1967. He joined IMS Lab (Integration; Materials and Systems) in 1981, where he was in charge to develop a new team in device failure analysis. Appointed full professor in 1982, he managed the reliability research group of IMS, was head of the Electronics Teaching Department of the University of Bordeaux., and member of the National University Council. He concentrated his research on developping new concepts on reliability physics, as well as technological and design solutions to answer the very high reliability challenge that has to face industry in the last years. He published around 200 research papers in International journals and conferences, and about 30 teaching papers in international conferences. He is currently Emeritus retired Professor.
List of areas of expertise relating to device reliability: Reliability physics accelerated testing, failure mechanisms, failure analysis, devices and IC technologies, reliability prediction.
Seminar3: Microelectronics and Nanotechnologies: engineering sciences at the heart of the connecting objects and of their applications
授课人：Dr O. Bonnaud
Outline:This seminar is devoted to students that can be aware about the evolution of the microelectronics field during the last fifty years, and about its new evolution that can open a lot of applications in many domains. Three parts will be approached:
·The field of microelectronics: evolution of the electronics from the discreet components to the integrated circuits thanks to the improvement of the technologies and of the computer aided design.
·The new integration combining microelectronics to other technologies such as mechanics, optics, biology, etc. Development of large area electronics, systems on chips, systems in package,
·Presentation of the architecture of the connected objects and of the importance of these new objects in the short future. Adaptation of the technologies to the connected objects for many application domains.
Dr O. Bonnaud is Emeritus Professor with “Institut d’Electronique et Télécommunications de Rennes” (IETR), Université de Rennes 1, France. Specialist in Microelectronics with a PhD in 1978, he obtained the full professor position in 1984 at University of Rennes 1 and Supelec (French “Grande Ecole”). He created in 1985 the Microelectronics Laboratory in Rennes that he managed during more than 20 years, and the Common Center of Microelectronics of West (CCMO). In the frame of these activities, he published more than 500 papers in journals, and proceedings of conferences, about three fourth for research purpose and one-fourth for pedagogical purpose. In 2010, he became Executive director of GIP-CNFM (Public Interest Groupment of “Coordination Nationale pour la Formation à la Microélectronique et aux nanotechnologies”. In this function, he coordinates the Higher education activities in microelectronics in France. Since 2011, he is Guest Foreign Professor of the South-East University, Nanjing, China. He obtained the position of “1000 Talents” Foreign Expert of the Chinese Government in 2013 that he always assumes.